-40%
JEOL Wafer Stage Assembly 200mm with Probes JWS-7555S Wafer Defect SEM Working
$ 1019.64
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Description
JEOL Wafer Stage Assembly 200mm with Probes JWS-7555S Wafer Defect SEM WorkingInventory # CONF-1299
Part No: Wafer Stage Assembly
Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System
This JEOL Wafer Stage Assembly 200mm JWS-7555S Wafer Defect Review SEM is used working surplus. The filaments are bent (see photos). The physical condition is good, but there are signs of previous use and handling.
Sale Details
Item Condition:
Used Working, 90 Day Warranty
Estimated Packed Shipping Dimensions:
L x W x H = 19"x39"x22" @ 250 lbs.; Requires Freight Shipping
Only items pictured are included:
If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
For items with multiple quantities:
The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
Items are sold with a
90-Day Satisfaction Guarantee
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